| Original language | English |
|---|---|
| Pages (from-to) | 925 |
| Number of pages | 1 |
| Journal | Guangzi Xuebao/Acta Photonica Sinica |
| Volume | 32 |
| Issue number | 8 |
| State | Published - Aug 2003 |
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Yuan, J., Chen, G., Lin, J., & Jiang, H. (2003). XPS analysis of AlGaN film grown by MOCVD. Guangzi Xuebao/Acta Photonica Sinica, 32(8), 925.