This paper presents a new technique to be used for the characterization of dielectric materials over a wide band of frequencies (RF to millimeter wave region). The cavity structure offers a well-defined reference plane for precision measurements of dielectric characteristics. The dielectric sample completely fills a cylindrical cavity adapted to a precision air line(s). Two configurations are considered: 1) the terminating cavity configuration in which the cavity is adapted to the end of a precision air line; 2) the through cavity configuration where the cavity is placed between two precision air lines. The measured scattering parameters, the reflection and/or the transmission coefficients, are used to determine the complex permittivity of the dielectric sample.
|Number of pages||8|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|State||Published - Apr 1989|