WideBand Measurement of the Complex Permittivity of Dielectric Materials Using a Wide-Band Cavity

Mohammad A. Saed, Sedki M. Riad, Aicha Elshabini-Riad

Research output: Contribution to journalArticle

11 Scopus citations

Abstract

This paper presents a new technique to be used for the characterization of dielectric materials over a wide band of frequencies (RF to millimeter wave region). The cavity structure offers a well-defined reference plane for precision measurements of dielectric characteristics. The dielectric sample completely fills a cylindrical cavity adapted to a precision air line(s). Two configurations are considered: 1) the terminating cavity configuration in which the cavity is adapted to the end of a precision air line; 2) the through cavity configuration where the cavity is placed between two precision air lines. The measured scattering parameters, the reflection and/or the transmission coefficients, are used to determine the complex permittivity of the dielectric sample.

Original languageEnglish
Pages (from-to)488-495
Number of pages8
JournalIEEE Transactions on Instrumentation and Measurement
Volume38
Issue number2
DOIs
StatePublished - Apr 1989

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