Abstract
This paper presents a new technique to be used for the characterization of dielectric materials over a wide band of frequencies (RF to millimeter wave region). The cavity structure offers a well-defined reference plane for precision measurements of dielectric characteristics. The dielectric sample completely fills a cylindrical cavity adapted to a precision air line(s). Two configurations are considered: 1) the terminating cavity configuration in which the cavity is adapted to the end of a precision air line; 2) the through cavity configuration where the cavity is placed between two precision air lines. The measured scattering parameters, the reflection and/or the transmission coefficients, are used to determine the complex permittivity of the dielectric sample.
Original language | English |
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Pages (from-to) | 488-495 |
Number of pages | 8 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 38 |
Issue number | 2 |
DOIs | |
State | Published - Apr 1989 |