Wideband Dielectric Characterization Using a Dielectric Filled Cavity Adapted to the End of a Transmission Line

Mohammad A. Saed; Sedki M. Riad; William A. Davis

doi:10.1109/19.106277

Wideband Dielectric Characterization Using a Dielectric Filled Cavity Adapted to the End of a Transmission Line

Mohammad A. Saed, Sedki M. Riad, William A. Davis

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

In this paper, the concept, analysis, and testing of a new technique for characterizing dielectric materials over a wide band of frequencies are presented. The technique utilizes a cylindrical cavity completely filled with a sample of the dielectric material under test and adapted to the end of a precision air line. The complex permittivity of the filling dielectric is derived from the measured reflection coefficient. This technique offers great advantages over conventional methods where the sample is placed in a resonant cavity or inserted in a transmission line.

Original language	English
Pages (from-to)	485-491
Number of pages	7
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	39
Issue number	3
DOIs	https://doi.org/10.1109/19.106277
State	Published - Jun 1990

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abstract = "In this paper, the concept, analysis, and testing of a new technique for characterizing dielectric materials over a wide band of frequencies are presented. The technique utilizes a cylindrical cavity completely filled with a sample of the dielectric material under test and adapted to the end of a precision air line. The complex permittivity of the filling dielectric is derived from the measured reflection coefficient. This technique offers great advantages over conventional methods where the sample is placed in a resonant cavity or inserted in a transmission line.",

author = "Saed, {Mohammad A.} and Riad, {Sedki M.} and Davis, {William A.}",

note = "Funding Information: Manuscript received July 25, 1989; revised January 26, 1990. This work was supported by DuPont Electronics, Wilrnington, DE, and the Center for Innovative Technology, Institute of Materials Science and Engineering, VA.",

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N2 - In this paper, the concept, analysis, and testing of a new technique for characterizing dielectric materials over a wide band of frequencies are presented. The technique utilizes a cylindrical cavity completely filled with a sample of the dielectric material under test and adapted to the end of a precision air line. The complex permittivity of the filling dielectric is derived from the measured reflection coefficient. This technique offers great advantages over conventional methods where the sample is placed in a resonant cavity or inserted in a transmission line.

AB - In this paper, the concept, analysis, and testing of a new technique for characterizing dielectric materials over a wide band of frequencies are presented. The technique utilizes a cylindrical cavity completely filled with a sample of the dielectric material under test and adapted to the end of a precision air line. The complex permittivity of the filling dielectric is derived from the measured reflection coefficient. This technique offers great advantages over conventional methods where the sample is placed in a resonant cavity or inserted in a transmission line.

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Wideband Dielectric Characterization Using a Dielectric Filled Cavity Adapted to the End of a Transmission Line

Abstract

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