TY - GEN
T1 - Visual pattern discovery using random projections
AU - Anand, Anushka
AU - Wilkinson, Leland
AU - Dang, Tuan Nhon
PY - 2012
Y1 - 2012
N2 - An essential element of exploratory data analysis is the use of revealing low-dimensional projections of high-dimensional data. Projection Pursuit has been an effective method for finding interesting low-dimensional projections of multidimensional spaces by optimizing a score function called a projection pursuit index. However, the technique is not scalable to high-dimensional spaces. Here, we introduce a novel method for discovering noteworthy views of high-dimensional data spaces by using binning and random projections. We define score functions, akin to projection pursuit indices, that characterize visual patterns of the low-dimensional projections that constitute feature subspaces. We also describe an analytic, multivariate visualization platform based on this algorithm that is scalable to extremely large problems.
AB - An essential element of exploratory data analysis is the use of revealing low-dimensional projections of high-dimensional data. Projection Pursuit has been an effective method for finding interesting low-dimensional projections of multidimensional spaces by optimizing a score function called a projection pursuit index. However, the technique is not scalable to high-dimensional spaces. Here, we introduce a novel method for discovering noteworthy views of high-dimensional data spaces by using binning and random projections. We define score functions, akin to projection pursuit indices, that characterize visual patterns of the low-dimensional projections that constitute feature subspaces. We also describe an analytic, multivariate visualization platform based on this algorithm that is scalable to extremely large problems.
KW - High-dimensional Data
KW - Random Projections
UR - http://www.scopus.com/inward/record.url?scp=84872963385&partnerID=8YFLogxK
U2 - 10.1109/VAST.2012.6400490
DO - 10.1109/VAST.2012.6400490
M3 - Conference contribution
AN - SCOPUS:84872963385
SN - 9781467347532
T3 - IEEE Conference on Visual Analytics Science and Technology 2012, VAST 2012 - Proceedings
SP - 43
EP - 52
BT - IEEE Conference on Visual Analytics Science and Technology 2012, VAST 2012 - Proceedings
Y2 - 14 October 2012 through 19 October 2012
ER -