Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN

W. H. Sun; K. M. Chen; Z. J. Yang; J. Li; Y. Z. Tong; S. X. Jin; G. Y. Zhang; Q. L. Zhang; G. G. Qin

doi:10.1063/1.370148

Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN

W. H. Sun, K. M. Chen, Z. J. Yang, J. Li, Y. Z. Tong, S. X. Jin, G. Y. Zhang, Q. L. Zhang, G. G. Qin

Engineering

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Abstract

Both Fourier transform infrared (FTIR) grazing incidence reflectivity and FTIR transmission methods have been used to study GaN films grown on α-Al₂O₃ (0001) substrates by atmospheric pressure metal-organic chemical vapor deposition and low pressure metal-organic chemical vapor deposition. The results show that in the frequency range from 400 to 3500 cm^-1 the signal-to-noise ratio of the FTIR grazing incidence measurement is far higher than that of the FTIR transmission measurement. Some new vibrational structures appearing in the former measurement have been discussed. The features around 1460 and 1300 cm^-1 are tentatively assigned to scissoring and wagging local vibrational modes of CH₂ in GaN, respectively.

Original language	English
Pages (from-to)	6430-6433
Number of pages	4
Journal	Journal of Applied Physics
Volume	85
Issue number	9
DOIs	https://doi.org/10.1063/1.370148
State	Published - May 1 1999

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title = "Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN",

abstract = "Both Fourier transform infrared (FTIR) grazing incidence reflectivity and FTIR transmission methods have been used to study GaN films grown on α-Al2O3 (0001) substrates by atmospheric pressure metal-organic chemical vapor deposition and low pressure metal-organic chemical vapor deposition. The results show that in the frequency range from 400 to 3500 cm-1 the signal-to-noise ratio of the FTIR grazing incidence measurement is far higher than that of the FTIR transmission measurement. Some new vibrational structures appearing in the former measurement have been discussed. The features around 1460 and 1300 cm-1 are tentatively assigned to scissoring and wagging local vibrational modes of CH2 in GaN, respectively.",

author = "Sun, {W. H.} and Chen, {K. M.} and Yang, {Z. J.} and J. Li and Tong, {Y. Z.} and Jin, {S. X.} and Zhang, {G. Y.} and Zhang, {Q. L.} and Qin, {G. G.}",

year = "1999",

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journal = "Journal of Applied Physics",

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T1 - Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN

AU - Sun, W. H.

AU - Chen, K. M.

AU - Yang, Z. J.

AU - Li, J.

AU - Tong, Y. Z.

AU - Jin, S. X.

AU - Zhang, G. Y.

AU - Zhang, Q. L.

AU - Qin, G. G.

PY - 1999/5/1

Y1 - 1999/5/1

N2 - Both Fourier transform infrared (FTIR) grazing incidence reflectivity and FTIR transmission methods have been used to study GaN films grown on α-Al2O3 (0001) substrates by atmospheric pressure metal-organic chemical vapor deposition and low pressure metal-organic chemical vapor deposition. The results show that in the frequency range from 400 to 3500 cm-1 the signal-to-noise ratio of the FTIR grazing incidence measurement is far higher than that of the FTIR transmission measurement. Some new vibrational structures appearing in the former measurement have been discussed. The features around 1460 and 1300 cm-1 are tentatively assigned to scissoring and wagging local vibrational modes of CH2 in GaN, respectively.

AB - Both Fourier transform infrared (FTIR) grazing incidence reflectivity and FTIR transmission methods have been used to study GaN films grown on α-Al2O3 (0001) substrates by atmospheric pressure metal-organic chemical vapor deposition and low pressure metal-organic chemical vapor deposition. The results show that in the frequency range from 400 to 3500 cm-1 the signal-to-noise ratio of the FTIR grazing incidence measurement is far higher than that of the FTIR transmission measurement. Some new vibrational structures appearing in the former measurement have been discussed. The features around 1460 and 1300 cm-1 are tentatively assigned to scissoring and wagging local vibrational modes of CH2 in GaN, respectively.

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EP - 6433

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9

ER -

Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN

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