Using a New Generation of Multimeters to Measure the Quantized Resistance

Robert Duncan, M. E. Cage, D. Y. Yu, B. M. Jeckelmann, R. L. Steiner

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)262
JournalIEEE Transactions on Instruments and Measurements
StatePublished - 1991

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