TY - GEN
T1 - Twin-domain epitaxial growth and metal-insulator transition of VO 2 thin film on C-plane sapphire
AU - Chen, Changhong
AU - Zhao, Yong
AU - Pan, Xuan
AU - Holtz, Mark
AU - Fan, Zhaoyang
N1 - Funding Information:
The authors acknowledge support for this work from U.S. Army CERDEC (W15P7T-07-DP040). C. Chen is grateful for WNLO-P080004 support.
PY - 2011
Y1 - 2011
N2 - We report heteroepitaxial growth of VO2 thin film on c-plane sapphire by pulsed DC magnetron sputtering. X-ray diffraction experiment indicates that the 150 nm thick film is in triple-domain (020)-epitaxial structure with six-fold rotational symmetry in the basal plane; in particular, off-axis Φ scans from (011) and (220) show twin and triple peaks in each group of the diffraction profiles due to angle β mismatch and V 4+-V4+ dimerization, respectively. The epitaxial relationship between VO2 and c-plane sapphire can be concluded as be VO2 [010] || Al2O3 [0001] and VO2 (202) || Al2O3 {1120}, with the in-plane lattice mismatch of 2.66% (tensile) along [202] and the out-of-plane lattice mismatch of-2.19% (compressive). Temperature dependence of resistivity in van der Pauw method shows that the resistivity changes by ∼5 orders of magnitude through the metal-insulator transition, and a narrow hysteresis window of ∼3 K is obtained between cooling and heating cycles with respect to phase-transition temperatures at 347.1 and 350.1 K.
AB - We report heteroepitaxial growth of VO2 thin film on c-plane sapphire by pulsed DC magnetron sputtering. X-ray diffraction experiment indicates that the 150 nm thick film is in triple-domain (020)-epitaxial structure with six-fold rotational symmetry in the basal plane; in particular, off-axis Φ scans from (011) and (220) show twin and triple peaks in each group of the diffraction profiles due to angle β mismatch and V 4+-V4+ dimerization, respectively. The epitaxial relationship between VO2 and c-plane sapphire can be concluded as be VO2 [010] || Al2O3 [0001] and VO2 (202) || Al2O3 {1120}, with the in-plane lattice mismatch of 2.66% (tensile) along [202] and the out-of-plane lattice mismatch of-2.19% (compressive). Temperature dependence of resistivity in van der Pauw method shows that the resistivity changes by ∼5 orders of magnitude through the metal-insulator transition, and a narrow hysteresis window of ∼3 K is obtained between cooling and heating cycles with respect to phase-transition temperatures at 347.1 and 350.1 K.
UR - http://www.scopus.com/inward/record.url?scp=80053205069&partnerID=8YFLogxK
U2 - 10.1557/opl.2011.153
DO - 10.1557/opl.2011.153
M3 - Conference contribution
AN - SCOPUS:80053205069
SN - 9781605112695
T3 - Materials Research Society Symposium Proceedings
SP - 73
EP - 78
BT - Oxide Nanoelectronics
T2 - 2010 MRS Fall Meeting
Y2 - 29 November 2010 through 3 December 2010
ER -