Tε* integral as a crack growth criterion

Yoshika Omori, Albert S. Kobayashi, Hiroshi Okada, Satya N. Atluri, Paul W. Tan

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Tε*-integral values associated with stable crack growth in thin 2024-T3 aluminum single edge notched (SEN), central notched (CN) and compact (CT) specimens were evaluated experimentally and numerically along a near-crack contour, Γε, which elongated with crack extension. The surface displacement fields, which were determined by Moiré interferometry and by an elastic-plastic finite element (FE) simulation of the measured stable crack growth, were used to determine the Tε*. The experimentally and numerically determined Tε*'s and those of the crack tip opening angles (CTOA), were in excellent agreements with each other. Variations in Tε* and CTOA with crack extension of all three specimens were in essential agreement, albeit the continually increasing Tε* of the SEN specimen.

Original languageEnglish
Pages (from-to)147-154
Number of pages8
JournalMechanics of Materials
Volume28
Issue number1-4
DOIs
StatePublished - Jul 1998

Keywords

  • Crack
  • Integral values
  • Surface

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