Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.
|Journal||Journal of Applied Physics|
|State||Published - 2007|