TiO2 breakdown under pulsed conditions

G. Zhao, R. P. Joshi, V. K. Lakdawala, E. Schamiloglu, H. Hjalmarson

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Abstract

Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.

Original languageEnglish
Article number026110
JournalJournal of Applied Physics
Volume101
Issue number2
DOIs
StatePublished - 2007

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