TiO2 breakdown under pulsed conditions

G. Zhao; R. P. Joshi; V. K. Lakdawala; E. Schamiloglu; H. Hjalmarson

doi:10.1063/1.2425001

TiO₂ breakdown under pulsed conditions

G. Zhao, R. P. Joshi, V. K. Lakdawala, E. Schamiloglu, H. Hjalmarson

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.

Original language	English
Article number	026110
Journal	Journal of Applied Physics
Volume	101
Issue number	2
DOIs	https://doi.org/10.1063/1.2425001
State	Published - 2007

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title = "TiO2 breakdown under pulsed conditions",

abstract = "Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.",

author = "G. Zhao and Joshi, {R. P.} and Lakdawala, {V. K.} and E. Schamiloglu and H. Hjalmarson",

note = "Funding Information: This work was sponsored in part by AFOSR and Sandia National Laboratories. Useful discussions with M. Kristiansen (TTU) and R. Curry (U. Missouri) are gratefully acknowledged.",

year = "2007",

doi = "10.1063/1.2425001",

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T1 - TiO2 breakdown under pulsed conditions

AU - Zhao, G.

AU - Joshi, R. P.

AU - Lakdawala, V. K.

AU - Schamiloglu, E.

AU - Hjalmarson, H.

N1 - Funding Information: This work was sponsored in part by AFOSR and Sandia National Laboratories. Useful discussions with M. Kristiansen (TTU) and R. Curry (U. Missouri) are gratefully acknowledged.

PY - 2007

Y1 - 2007

N2 - Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.

AB - Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.

UR - http://www.scopus.com/inward/record.url?scp=33847724715&partnerID=8YFLogxK

U2 - 10.1063/1.2425001

DO - 10.1063/1.2425001

M3 - Article

AN - SCOPUS:33847724715

SN - 0021-8979

VL - 101

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 2

M1 - 026110

ER -

TiO₂ breakdown under pulsed conditions

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