TiO2 breakdown under pulsed conditions

G. Zhao, R. P. Joshi, V. K. Lakdawala, E. Schamiloglu, H. Hjalmarson

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Model studies of current conduction and breakdown in Ti O2 were carried out. Our simulation results indicate that electrical breakdown of Ti O2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in Ti O2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries.

Original languageEnglish
Article number026110
JournalJournal of Applied Physics
Issue number2
StatePublished - 2007

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    Zhao, G., Joshi, R. P., Lakdawala, V. K., Schamiloglu, E., & Hjalmarson, H. (2007). TiO2 breakdown under pulsed conditions. Journal of Applied Physics, 101(2), [026110]. https://doi.org/10.1063/1.2425001