The authors present a new sample holder to be used for the characterization of dielectric materials over a wide band of frequencies. The dielectric fills a cylindrical cavity that is adapted to 50-Ω precision air line(s). The scattering parameters, measured in the time domain, are used to determine the complex dielectric constant of the material. Computer simulation and experimental results are presented for terminated and through-cavity configurations.
|Number of pages||2|
|Journal||CPEM Digest (Conference on Precision Electromagnetic Measurements)|
|State||Published - 1988|
|Event||CPEM '88 Digest: 1988 Conference on Precision Electromagnetic Measurements - Tsukuba, Jpn|
Duration: Jun 7 1988 → Jun 10 1988