@inproceedings{63c5ce8264a54b9d94b59715dab950e8,
title = "Thermal neutron detectors based on hexagonal boron nitride epilayers",
abstract = "Solid-state neutron detectors with high performances are urgently sought after for the detection of fissile materials. Until now, direct-conversion neutron detectors based on semiconductors with a measureable efficiency have not been realized. We have successfully synthesized hexagonal boron nitride (h-BN) epilayers with varying thicknesses (0.3 μm - 50 μm) by metal organic chemical vapor deposition (MOCVD) on sapphire substrates. In this paper, we present the detailed characterization of thermal neutron detectors fabricated from h-BN epilayers with a thickness up to 5 m to obtain insights into the h-BN epilayer thickness dependence of the device performance. The results revealed that the charge collection efficiency is almost independent of the h-BN epilayer thickness. By minimizing h-BN material removal by dry etching, it was shown that detectors incorporating an isotopically 10B-enriched h-BN epilayer of 2.7 μm in thickness exhibited an overall detection efficiency for thermal neutrons of 4% and a charge collection efficiency as high as 83%. By doing away altogether with dry etching, we have successfully realized a simple vertical 43 μm thick h-10BN detector which delivers a detection efficiency of 51.4% for thermal neutrons, which is the highest reported efficiency for any semiconductor-based neutron detector The h-BN detectors possess all the advantages of semiconductor devices including low cost, high efficiency and sensitivity, wafer-scale processing, compact size, light weight, and ability to integrate with other functional devices.",
keywords = "Hexagonal boron nitride, direct-conversion neutron detectors, solid-state neutron detectors, wide bandgap semiconductors.",
author = "Doan, {T. C.} and A. Marty and J. Li and Lin, {J. Y.} and Jiang, {H. X.}",
note = "Publisher Copyright: {\textcopyright} SPIE 2016.; SPIE Conference on Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII ; Conference date: 29-08-2016 Through 31-08-2016",
year = "2016",
doi = "10.1117/12.2239079",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Arnold Burger and Payne, {Stephen A.} and Franks, {Larry A.} and James, {Ralph B.} and James, {Ralph B.} and Michael Fiederle",
booktitle = "Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII",
}