Thermal analysis of 4H-SiC DMOSFET structure under resistive switching

Bejoy N. Pushpakaran, Stephen B. Bayne, Aderinto A. Ogunniyi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Thermal analysis of 4H-SiC DMOSFET structure under resistive switching'. Together they form a unique fingerprint.

Engineering & Materials Science