Theory of RF window failure

A. Valfells, L. K. Ang, Y. Y. Lau, R. M. Gilgenbach, R. A. Kishek, J. Verboncoeur, A. Neuber, H. Krompholz, L. L. Hatfield

Research output: Contribution to journalConference articlepeer-review


We have recently developed a novel theory of multipactor discharge on a dielectric. The main results include the susceptibility diagram and the prediction that about one percent of the RF power is deposited to the dielectric surface over a wide range of conditions. In this paper, we extend the analysis to include the effects of outgassing and the subsequent ionization by the multipactoring electrons. This is an attempt to understand the final stage of dielectric failure that is initiated by multipactor. Similarities and differences in such failures, under RF and DC conditions, are explored. Analytic theory and simulation results will be presented and compared with experiments.

Original languageEnglish
Pages (from-to)105
Number of pages1
JournalIEEE International Conference on Plasma Science
StatePublished - 1999
EventThe 26th IEEE International Conference on Plasma Science (ICOPS99) - Monterey, CA, USA
Duration: Jun 20 1999Jun 24 1999


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