TY - GEN
T1 - The impact of water conductivity, electrode material, and electrode surface roughness on the pulsed breakdown strength of water
AU - Wetz, D.
AU - Mankowski, J.
AU - McCauley, D.
AU - Dickens, J.
AU - Kristiansen, M.
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2006
Y1 - 2006
N2 - Experimental results are presented on the impact water conductivity, electrode material, and electrode surface roughness have on the dielectric strength of water. A 2 mm water gap was tested under pulsed conditions with maximum electric fields in excess of 1.5 MV/cm. Bruce profiled electrodes manufactured from various materials including Molybdenum, Aluminum, Copper, Tungsten, Nickel, Stainless Steel, and Zinc Oxide, which have work functions ranging from 4.2 eV to 5.3 eV, have been tested. The roughness average of the various surfaces was varied from 0.1 μm to 1.96 μm and the conductivity of the water within the gap was varied from 1 μS/cm to 39 μS/cm to determine the impact each has when tested in combination with the various electrode materials and surface roughnesses. Conclusions are made as to the effect each of these factors has on the holdoff strength of a water dielectric system.
AB - Experimental results are presented on the impact water conductivity, electrode material, and electrode surface roughness have on the dielectric strength of water. A 2 mm water gap was tested under pulsed conditions with maximum electric fields in excess of 1.5 MV/cm. Bruce profiled electrodes manufactured from various materials including Molybdenum, Aluminum, Copper, Tungsten, Nickel, Stainless Steel, and Zinc Oxide, which have work functions ranging from 4.2 eV to 5.3 eV, have been tested. The roughness average of the various surfaces was varied from 0.1 μm to 1.96 μm and the conductivity of the water within the gap was varied from 1 μS/cm to 39 μS/cm to determine the impact each has when tested in combination with the various electrode materials and surface roughnesses. Conclusions are made as to the effect each of these factors has on the holdoff strength of a water dielectric system.
UR - http://www.scopus.com/inward/record.url?scp=48349118240&partnerID=8YFLogxK
U2 - 10.1109/MODSYM.2006.365192
DO - 10.1109/MODSYM.2006.365192
M3 - Conference contribution
AN - SCOPUS:48349118240
SN - 142440018X
SN - 9781424400188
T3 - Conference Record of the International Power Modulator Symposium and High Voltage Workshop
SP - 104
EP - 107
BT - 2006 IEEE International Power Modulator Conference, IPMC(27th Power Modulator Symposium and 2006 High Voltage Workshop)
Y2 - 14 May 2006 through 18 May 2006
ER -