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Suitability of N-ON recessed implanted gate vertical-channel SiC JFETs for optically triggered 1200 v solid-state-circuit-breakers
V. Veliadis, B. Steiner, K. Lawson, S. B. Bayne, D. Urciuoli, H. C. Ha
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review