Structural verification of a WLAN system using built-in self tests

D. Webster, J. Cavazos, D. Guy, P. Patchen, D. Y.C. Lie

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.

Original languageEnglish
Title of host publicationProceedings of the 2010 IEEE Dallas Circuits and Systems Workshop
Subtitle of host publicationDesign Automation, Methodologies and Manufacturability, DCAS 2010
DOIs
StatePublished - 2010
Event2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010 - Richardson, TX, United States
Duration: Oct 17 2010Oct 18 2010

Publication series

NameProceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010

Conference

Conference2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010
CountryUnited States
CityRichardson, TX
Period10/17/1010/18/10

Keywords

  • Built-in self-testing (BiST)
  • CMOS integrated circuits
  • Wireless LAN

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