Structural verification of a WLAN system using built-in self tests

D. Webster; J. Cavazos; D. Guy; P. Patchen; D. Y.C. Lie

doi:10.1109/DCAS.2010.5955035

Structural verification of a WLAN system using built-in self tests

D. Webster, J. Cavazos, D. Guy, P. Patchen, D. Y.C. Lie

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.

Original language	English
Title of host publication	Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop
Subtitle of host publication	Design Automation, Methodologies and Manufacturability, DCAS 2010
DOIs	https://doi.org/10.1109/DCAS.2010.5955035
State	Published - 2010
Event	2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010 - Richardson, TX, United States Duration: Oct 17 2010 → Oct 18 2010

Publication series

Name	Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010

Conference

Conference	2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010
Country/Territory	United States
City	Richardson, TX
Period	10/17/10 → 10/18/10

Keywords

Built-in self-testing (BiST)
CMOS integrated circuits
Wireless LAN

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10.1109/DCAS.2010.5955035

Cite this

Webster, D., Cavazos, J., Guy, D., Patchen, P., & Lie, D. Y. C. (2010). Structural verification of a WLAN system using built-in self tests. In Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010 Article 5955035 (Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010). https://doi.org/10.1109/DCAS.2010.5955035

Webster, D. ; Cavazos, J. ; Guy, D. et al. / Structural verification of a WLAN system using built-in self tests. Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010. 2010. (Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010).

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title = "Structural verification of a WLAN system using built-in self tests",

abstract = "This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.",

keywords = "Built-in self-testing (BiST), CMOS integrated circuits, Wireless LAN",

author = "D. Webster and J. Cavazos and D. Guy and P. Patchen and Lie, {D. Y.C.}",

year = "2010",

doi = "10.1109/DCAS.2010.5955035",

language = "English",

isbn = "9781424495344",

series = "Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010",

booktitle = "Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop",

note = "2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010 ; Conference date: 17-10-2010 Through 18-10-2010",

}

Webster, D, Cavazos, J, Guy, D, Patchen, P & Lie, DYC 2010, Structural verification of a WLAN system using built-in self tests. in Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010., 5955035, Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010, 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010, Richardson, TX, United States, 10/17/10. https://doi.org/10.1109/DCAS.2010.5955035

Structural verification of a WLAN system using built-in self tests. / Webster, D.; Cavazos, J.; Guy, D. et al.
Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010. 2010. 5955035 (Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Structural verification of a WLAN system using built-in self tests

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AU - Cavazos, J.

AU - Guy, D.

AU - Patchen, P.

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AB - This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.

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DO - 10.1109/DCAS.2010.5955035

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T3 - Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010

BT - Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop

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Webster D, Cavazos J, Guy D, Patchen P, Lie DYC. Structural verification of a WLAN system using built-in self tests. In Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010. 2010. 5955035. (Proceedings of the 2010 IEEE Dallas Circuits and Systems Workshop: Design Automation, Methodologies and Manufacturability, DCAS 2010). doi: 10.1109/DCAS.2010.5955035

Structural verification of a WLAN system using built-in self tests

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