Structural analysis of N-polar AlN layers grown on Si (111) substrates by high resolution X-ray diffraction

Mahesh Pandikunta, Oleg Ledyaev, Vladimir Kuryatkov, Sergey Nikishin

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)487
Journalphysica status solidi c
StatePublished - 2014

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