| Original language | English |
|---|---|
| Pages (from-to) | 027202 |
| Journal | Optical Engineering |
| State | Published - 2008 |
Statistical approach to unsupervised defect detection and multiscale localization in two-texture images
Arunkumar Gururajan, Hamed Sari-Sarraf, Eric Hequet
Research output: Contribution to journal › Article