| Original language | English |
|---|---|
| Journal | Society of Photo-Optical Instrumentation Engineers |
| State | Published - 2008 |
Statistical Approach to Unsupervised Defect Detection and Multiscale localization in Two-Texture Images
Eric Hequet, Hamed Sari-Sarraf, Arunkumar Gururajan
Research output: Contribution to journal › Article