Sputtered films of PdMn for thermometry and bolometry

R. C. Nelson; D. A. Sergatskov; R. V. Duncan

doi:10.1023/A:1013795924263

Sputtered films of PdMn for thermometry and bolometry

R. C. Nelson, D. A. Sergatskov, R. V. Duncan

Physics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, T_c, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

Original language	English
Pages (from-to)	649-654
Number of pages	6
Journal	Journal of Low Temperature Physics
Volume	126
Issue number	1-2
DOIs	https://doi.org/10.1023/A:1013795924263
State	Published - 2002

Access to Document

10.1023/A:1013795924263

Link to publication in Scopus

Fingerprint Dive into the research topics of 'Sputtered films of PdMn for thermometry and bolometry'. Together they form a unique fingerprint.

Cite this

@article{cda8e0ac70fd423899025d754fa9639a,

title = "Sputtered films of PdMn for thermometry and bolometry",

abstract = "Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.",

author = "Nelson, {R. C.} and Sergatskov, {D. A.} and Duncan, {R. V.}",

year = "2002",

doi = "10.1023/A:1013795924263",

language = "English",

volume = "126",

pages = "649--654",

journal = "Journal of Low Temperature Physics",

issn = "0022-2291",

number = "1-2",

}

TY - JOUR

T1 - Sputtered films of PdMn for thermometry and bolometry

AU - Nelson, R. C.

AU - Sergatskov, D. A.

AU - Duncan, R. V.

PY - 2002

Y1 - 2002

N2 - Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

AB - Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

UR - http://www.scopus.com/inward/record.url?scp=0036115574&partnerID=8YFLogxK

U2 - 10.1023/A:1013795924263

DO - 10.1023/A:1013795924263

M3 - Article

AN - SCOPUS:0036115574

VL - 126

SP - 649

EP - 654

JO - Journal of Low Temperature Physics

JF - Journal of Low Temperature Physics

SN - 0022-2291

IS - 1-2

ER -