Sputtered films of PdMn for thermometry and bolometry

R. C. Nelson; D. A. Sergatskov; R. V. Duncan

doi:10.1023/A:1013795924263

Sputtered films of PdMn for thermometry and bolometry

R. C. Nelson, D. A. Sergatskov, R. V. Duncan

Physics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, T_c, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

Original language	English
Pages (from-to)	649-654
Number of pages	6
Journal	Journal of Low Temperature Physics
Volume	126
Issue number	1-2
DOIs	https://doi.org/10.1023/A:1013795924263
State	Published - 2002

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abstract = "Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.",

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year = "2002",

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AU - Nelson, R. C.

AU - Sergatskov, D. A.

AU - Duncan, R. V.

PY - 2002

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N2 - Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

AB - Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

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DO - 10.1023/A:1013795924263

M3 - Article

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JO - Journal of Low Temperature Physics

JF - Journal of Low Temperature Physics

SN - 0022-2291

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ER -

Sputtered films of PdMn for thermometry and bolometry

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