Sputtered films of PdMn for thermometry and bolometry

R. C. Nelson, D. A. Sergatskov, R. V. Duncan

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.

Original languageEnglish
Pages (from-to)649-654
Number of pages6
JournalJournal of Low Temperature Physics
Volume126
Issue number1-2
DOIs
StatePublished - 2002

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