TY - JOUR
T1 - Sputtered films of PdMn for thermometry and bolometry
AU - Nelson, R. C.
AU - Sergatskov, D. A.
AU - Duncan, R. V.
N1 - Copyright:
Copyright 2005 Elsevier B.V., All rights reserved.
PY - 2002
Y1 - 2002
N2 - Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.
AB - Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness ≤ 1.0 μm) show significant domain scale noise below the Curie Temperature, Tc, while thicker films (thickness ≥ 10 μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.
UR - http://www.scopus.com/inward/record.url?scp=0036115574&partnerID=8YFLogxK
U2 - 10.1023/A:1013795924263
DO - 10.1023/A:1013795924263
M3 - Article
AN - SCOPUS:0036115574
VL - 126
SP - 649
EP - 654
JO - Journal of Low Temperature Physics
JF - Journal of Low Temperature Physics
SN - 0022-2291
IS - 1-2
ER -