@inproceedings{aef59fa31b5e48d1999230b48f6a3232,
title = "Spatially resolved electron-beam induced current transient spectroscopy for deep-center characterization of diamond",
abstract = "Current transient spectroscopy has been used to determine the deep level structure in natural diamond up to activation energies of 1 eV. The material was activated by high-energy electrons. By varying the energy and consequently the range of the electrons in diamond, it was possible to obtain information on the depth distribution of three deep centers. The current transients were evaluated by applying a curve-fitting technique, which provides a better energy resolution than the commonly used window technique.",
author = "Schoenbach, {Karl H.} and T. Tessnow and Joshi, {Ravindra P.} and Roush, {Randy A.} and Brinkmann, {Ralf P.}",
year = "1994",
language = "English",
isbn = "0819414468",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
pages = "36--43",
editor = "Tamor, {Mike A.} and Mohammad Aslam",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Diamond-Film Semiconductors ; Conference date: 27-01-1994 Through 28-01-1994",
}