TY - JOUR
T1 - Simulation studies of internal mechanisms in the static deflection of a cellulose electroactive paper actuator
AU - Joshi, R. P.
AU - Mbaye, F.
AU - Basappa, P.
AU - Jang, S. D.
AU - Kim, J.
AU - Hall, J. C.
N1 - Funding Information:
Useful discussions with K. Song (Norfolk State University), A. Pisano (University California, Berkley) and Y. Bar-Cohen (JPL, Caltech.) are gratefully acknowledged. The experimental work was supported by the Creative Research Initiation (EAPap Actuator) of KOSEF/MOST. Support from the Center for Biotechnology and Biomedical Sciences at Norfolk State University under NIH Grant No. P20 MD001822-02 is gratefully acknowledged.
PY - 2008
Y1 - 2008
N2 - Studies of voltage-induced deflections in electroactive paper (EAPap) have been carried out. On the experimental side, measurements of bias-dependent deflections and strain, water absorption as a function of time, and relative humidity were obtained for the cellulose EAPap actuator. In addition, model simulations have also been carried out to probe and quantify the role of the various internal mechanisms responsible for the deflection. Our simulation predictions yield good agreement with the measured deflection data for the EAPap. The modeling suggests that internal ion content and its migration, water absorption leading to a nonuniform permittivity, random variations in the transverse piezoelectric-coupling coefficient d31,i, and the modulus of elasticity all collectively contribute to the EAPap deflection electrophysics. It also appears that higher sensitivity, with a minimal bias dependence, could be achieved by deliberately adding ions during EAPap processing.
AB - Studies of voltage-induced deflections in electroactive paper (EAPap) have been carried out. On the experimental side, measurements of bias-dependent deflections and strain, water absorption as a function of time, and relative humidity were obtained for the cellulose EAPap actuator. In addition, model simulations have also been carried out to probe and quantify the role of the various internal mechanisms responsible for the deflection. Our simulation predictions yield good agreement with the measured deflection data for the EAPap. The modeling suggests that internal ion content and its migration, water absorption leading to a nonuniform permittivity, random variations in the transverse piezoelectric-coupling coefficient d31,i, and the modulus of elasticity all collectively contribute to the EAPap deflection electrophysics. It also appears that higher sensitivity, with a minimal bias dependence, could be achieved by deliberately adding ions during EAPap processing.
UR - http://www.scopus.com/inward/record.url?scp=41549086155&partnerID=8YFLogxK
U2 - 10.1063/1.2891676
DO - 10.1063/1.2891676
M3 - Article
AN - SCOPUS:41549086155
VL - 103
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 6
M1 - 064912
ER -