Abstract
High-quality short-period superlattices of AlN/Al 0.08Ga 0.92N have been grown by gas-source molecular-beam epitaxy with ammonia on Al face of AlN (0001) substrates. A significant reduction was achieved in the dislocation density, down to 3 × 10 8 cm -2. Complete removal of residual Al 2O 3 surface oxide is needed in order to obtain low dislocation density in homoepitaxy on AlN. We show that the presence of Al 2O 3 islands with the surface coverage as low as 0.2% results in increased dislocation density.
Original language | English |
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Pages (from-to) | 4355-4357 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 19 |
DOIs | |
State | Published - Nov 8 2004 |