Self-management of external device failures in embedded software systems

Michael E. Shin, Poonam Mane

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Embedded software systems interact with several external devices that may come across faults or failures. Most of the approaches have focused on software and hardware systems, but relatively less attention has been given to self-management of faults or failures of external devices in embedded software systems. It is necessary to develop an approach such that faults or failures of external devices in embedded software systems are detected and self-managed. This paper describes an approach to establishing a framework for detecting and self-managing the failures of external devices for embedded software systems. Failed external devices are identified based on external device types, being self-managed in different ways. The proposed approach in this paper is applied to the use case modeling of an elevator system case study.

Original languageEnglish
Title of host publicationSEKE 2011 - Proceedings of the 23rd International Conference on Software Engineering and Knowledge Engineering
Pages543-546
Number of pages4
StatePublished - 2011
EventSEKE 2011 - Proceedings of the 23rd International Conference on Software Engineering and Knowledge Engineering - Miami, FL, United States
Duration: Jul 7 2011Jul 9 2011

Publication series

NameSEKE 2011 - Proceedings of the 23rd International Conference on Software Engineering and Knowledge Engineering

Conference

ConferenceSEKE 2011 - Proceedings of the 23rd International Conference on Software Engineering and Knowledge Engineering
CountryUnited States
CityMiami, FL
Period07/7/1107/9/11

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