Scanning Light-Diffracted Microscopy

Hira Farroq; Sueli Skinner-Ramos; Luis Grave De Peralta

Scanning Light-Diffracted Microscopy

Hira Farroq, Sueli Skinner-Ramos, Luis Grave De Peralta

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We simulated and experimentally demonstrated a novel subwavelength resolution microscopy technique by illuminating the sample with the hollow-cone of light produced by a ring-shaped condenser and scanning the diffracted light using a slit.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781943580422
State	Published - Aug 6 2018
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: May 13 2018 → May 18 2018

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	05/13/18 → 05/18/18

Cite this

@inproceedings{8e043794604f4cd5a02c04b1aa1504ad,

title = "Scanning Light-Diffracted Microscopy",

abstract = "We simulated and experimentally demonstrated a novel subwavelength resolution microscopy technique by illuminating the sample with the hollow-cone of light produced by a ring-shaped condenser and scanning the diffracted light using a slit.",

author = "Hira Farroq and Sueli Skinner-Ramos and {De Peralta}, {Luis Grave}",

note = "Publisher Copyright: {\textcopyright} 2018 OSA.; null ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

month = aug,

day = "6",

language = "English",

isbn = "9781943580422",

series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

}

Farroq, H, Skinner-Ramos, S & De Peralta, LG 2018, Scanning Light-Diffracted Microscopy. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8426915, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 05/13/18.

Scanning Light-Diffracted Microscopy. / Farroq, Hira; Skinner-Ramos, Sueli; De Peralta, Luis Grave.

2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8426915 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Scanning Light-Diffracted Microscopy

AU - Farroq, Hira

AU - Skinner-Ramos, Sueli

AU - De Peralta, Luis Grave

PY - 2018/8/6

Y1 - 2018/8/6

N2 - We simulated and experimentally demonstrated a novel subwavelength resolution microscopy technique by illuminating the sample with the hollow-cone of light produced by a ring-shaped condenser and scanning the diffracted light using a slit.

AB - We simulated and experimentally demonstrated a novel subwavelength resolution microscopy technique by illuminating the sample with the hollow-cone of light produced by a ring-shaped condenser and scanning the diffracted light using a slit.

UR - http://www.scopus.com/inward/record.url?scp=85052603565&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85052603565

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 13 May 2018 through 18 May 2018

ER -

Scanning Light-Diffracted Microscopy

Abstract

Publication series

Conference

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