Runtime self-calibrated temperature-stress cosensor for 3-D integrated circuits

Chun Zhang, Dian Ma, Changzhi Li, Yiyu Shi

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

On-chip temperature and stress sensors are important for runtime system management techniques tackling thermomechanical reliability issues in 3-D integrated circuits (ICs). However, traditional temperature and stress sensor designs require large calibration overhead to improve accuracy, which incurs significant cost for massive production. To address the challenge, in this paper, we propose a novel temperature-stress cosensor design for 3-D ICs. By exploring the inherent reciprocity of temperature and stress mechanisms, it achieves runtime self-calibration such that no dedicated calibration effort is needed. Simulation results show that the cosensor achieves 0.26 C and 0.43 MPa accuracy on average in temperature and stress measurements, respectively, when evaluated in-60 C, 140 C}. In addition, the accuracy of self-calibrated sensors remains within 1.1 C} and 2.3 MPa when there exists up to 5% measurement noise, which shows that the self-calibration process is relatively insensitive to various noises.

Original languageEnglish
Article number6675079
Pages (from-to)2411-2417
Number of pages7
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume22
Issue number11
DOIs
StatePublished - Nov 1 2014

Keywords

  • Self-calibration
  • temperature-stress cosensor
  • thermomechanical reliability.

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