“RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)

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20. “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)

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