“RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)

Yu-Chun Lie

“RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

20. “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)

Original language	English
Journal	“RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)
State	Published - Jun 2008

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Lie, Y-C. (2008). “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008). “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008).

Lie, Yu-Chun. / “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008). In: “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008). 2008.

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“RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008). / Lie, Yu-Chun.
In: “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008), 06.2008.

Research output: Contribution to journal › Article › peer-review

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AB - 20. “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008)

M3 - Article

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Lie Y-C. “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008). “RF Phase Error Built-in-Self-Test for GSM/EDGE”, D. Webster, L. Phan, O. Eliezer, R. Hudgens and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 39-44, June (2008). 2008 Jun.