Replacing error vector magnitude test with RF and analog BISTs

Dallas Webster; Rick Hudgens; Donald Lie

doi:10.1109/MDT.2011.1

Replacing error vector magnitude test with RF and analog BISTs

Dallas Webster, Rick Hudgens, Donald Lie

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

Original language	English
Article number	5685236
Pages (from-to)	66-75
Number of pages	10
Journal	IEEE Design and Test of Computers
Volume	28
Issue number	6
DOIs	https://doi.org/10.1109/MDT.2011.1
State	Published - Nov 2011

Keywords

BIST
CMOS integrated circuits
EVM
RF-BIST
RF-SoC
SoC
design and test
production test
self-calibration
self-testing
wireless LAN

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10.1109/MDT.2011.1

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Replacing error vector magnitude test with RF and analog BISTs

Abstract

Keywords

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