Replacing error vector magnitude test with RF and analog BISTs

Dallas Webster, Rick Hudgens, Donald Lie

Research output: Contribution to journalArticlepeer-review

5 Scopus citations


RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

Original languageEnglish
Article number5685236
Pages (from-to)66-75
Number of pages10
JournalIEEE Design and Test of Computers
Issue number6
StatePublished - Nov 2011


  • BIST
  • CMOS integrated circuits
  • EVM
  • RF-SoC
  • SoC
  • design and test
  • production test
  • self-calibration
  • self-testing
  • wireless LAN


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