Replacing error vector magnitude test with RF and analog BISTs

Dallas Webster; Rick Hudgens; Donald Lie

doi:10.1109/MDT.2011.1

Replacing error vector magnitude test with RF and analog BISTs

Dallas Webster, Rick Hudgens, Donald Lie

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

Original language	English
Article number	5685236
Pages (from-to)	66-75
Number of pages	10
Journal	IEEE Design and Test of Computers
Volume	28
Issue number	6
DOIs	https://doi.org/10.1109/MDT.2011.1
State	Published - Nov 2011

Keywords

BIST
CMOS integrated circuits
EVM
RF-BIST
RF-SoC
SoC
design and test
production test
self-calibration
self-testing
wireless LAN

Access to Document

10.1109/MDT.2011.1

Fingerprint Dive into the research topics of 'Replacing error vector magnitude test with RF and analog BISTs'. Together they form a unique fingerprint.

Cite this

@article{43459bc3f1df478db34c360eb6ad10cb,

title = "Replacing error vector magnitude test with RF and analog BISTs",

abstract = "RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.",

keywords = "BIST, CMOS integrated circuits, EVM, RF-BIST, RF-SoC, SoC, design and test, production test, self-calibration, self-testing, wireless LAN",

author = "Dallas Webster and Rick Hudgens and Donald Lie",

year = "2011",

month = nov,

doi = "10.1109/MDT.2011.1",

language = "English",

volume = "28",

pages = "66--75",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

number = "6",

}

TY - JOUR

T1 - Replacing error vector magnitude test with RF and analog BISTs

AU - Webster, Dallas

AU - Hudgens, Rick

AU - Lie, Donald

PY - 2011/11

Y1 - 2011/11

N2 - RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

AB - RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

KW - BIST

KW - CMOS integrated circuits

KW - EVM

KW - RF-BIST

KW - RF-SoC

KW - SoC

KW - design and test

KW - production test

KW - self-calibration

KW - self-testing

KW - wireless LAN

UR - http://www.scopus.com/inward/record.url?scp=84855669122&partnerID=8YFLogxK

U2 - 10.1109/MDT.2011.1

DO - 10.1109/MDT.2011.1

M3 - Article

AN - SCOPUS:84855669122

VL - 28

SP - 66

EP - 75

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

SN - 0740-7475

IS - 6

M1 - 5685236

ER -