Abstract
RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100 of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.
Original language | English |
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Article number | 5685236 |
Pages (from-to) | 66-75 |
Number of pages | 10 |
Journal | IEEE Design and Test of Computers |
Volume | 28 |
Issue number | 6 |
DOIs | |
State | Published - Nov 2011 |
Keywords
- BIST
- CMOS integrated circuits
- EVM
- RF-BIST
- RF-SoC
- SoC
- design and test
- production test
- self-calibration
- self-testing
- wireless LAN