| Original language | English |
|---|---|
| Journal | D.L. Webster, H. P. Largey, and D.Y.C. Lie, IEEE Design & Tests of Computers, issue 99, Jan. 10 (2011) |
| State | Published - 2011 |
Replacing Error Vector Magnitude (EVM) Tests with RF and Analog BiSTs
Research output: Contribution to journal › Article