Remote Measurement of Dielectric Constants for Samples with Arbitrary Cross Sections

Yingchao Xie, Fazhong Shen, Tianyi Zhou, Bin Zhang, Jun Wang, Changzhi Li, Lixin Ran

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Measurements of dielectric constant are of significant importance. Existing methods, contact or noncontact, require the sample under test (SUT) with a specified dimension. It can be the cross section of a rectangular waveguide or a regular-shaped reference SUT. In this work, a new approach extended from microwave imaging is proposed to remotely measure the dielectric constants of 2-D SUTs with arbitrary cross sections. An algorithm based on scattering integral equations is derived for an efficient parameter retrieval. Experimental measurements based on a time-division bistatic multiantenna system were conducted. It is verified that by deriving an inverse scattering problem-based algorithm, the dielectric constants of such SUTs can be effectively retrieved from the scattering data detected by a measurement setup previously designed for microwave imaging, regardless of the complexity of their cross sections. The proposed approach can be readily applied to various 2-D samples such as dielectric section bars. It can also be conveniently extended to 3-D samples in the future.

Original languageEnglish
Article number9178315
Pages (from-to)1005-1008
Number of pages4
JournalIEEE Microwave and Wireless Components Letters
Volume30
Issue number10
DOIs
StatePublished - Oct 2020

Keywords

  • Dielectric constant
  • inverse scattering problem
  • microwave imaging
  • remote measurement

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