Abstract
Measurements of dielectric constant are of significant importance. Existing methods, contact or noncontact, require the sample under test (SUT) with a specified dimension. It can be the cross section of a rectangular waveguide or a regular-shaped reference SUT. In this work, a new approach extended from microwave imaging is proposed to remotely measure the dielectric constants of 2-D SUTs with arbitrary cross sections. An algorithm based on scattering integral equations is derived for an efficient parameter retrieval. Experimental measurements based on a time-division bistatic multiantenna system were conducted. It is verified that by deriving an inverse scattering problem-based algorithm, the dielectric constants of such SUTs can be effectively retrieved from the scattering data detected by a measurement setup previously designed for microwave imaging, regardless of the complexity of their cross sections. The proposed approach can be readily applied to various 2-D samples such as dielectric section bars. It can also be conveniently extended to 3-D samples in the future.
Original language | English |
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Article number | 9178315 |
Pages (from-to) | 1005-1008 |
Number of pages | 4 |
Journal | IEEE Microwave and Wireless Components Letters |
Volume | 30 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2020 |
Keywords
- Dielectric constant
- inverse scattering problem
- microwave imaging
- remote measurement