TY - JOUR
T1 - Remote Measurement of Dielectric Constants for Samples with Arbitrary Cross Sections
AU - Xie, Yingchao
AU - Shen, Fazhong
AU - Zhou, Tianyi
AU - Zhang, Bin
AU - Wang, Jun
AU - Li, Changzhi
AU - Ran, Lixin
N1 - Funding Information:
Manuscript received May 9, 2020; accepted August 1, 2020. Date of publication August 26, 2020; date of current version October 7, 2020. This work was supported by NSFC under Grant 61771421, Grant 61901414, and Grant 51607168; and in part by the Natural Science Foundation of Ningbo under Grant 2019A610072. (Yingchao Xie, Fazhong Shen, and Tianyi Zhou contributed equally to this work.) (Corresponding author: Lixin Ran.) Yingchao Xie, Fazhong Shen, Bin Zhang, and Lixin Ran are with the Laboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, China (e-mail: ranlx@zju.edu.cn).
Publisher Copyright:
© 2020 IEEE.
PY - 2020/10
Y1 - 2020/10
N2 - Measurements of dielectric constant are of significant importance. Existing methods, contact or noncontact, require the sample under test (SUT) with a specified dimension. It can be the cross section of a rectangular waveguide or a regular-shaped reference SUT. In this work, a new approach extended from microwave imaging is proposed to remotely measure the dielectric constants of 2-D SUTs with arbitrary cross sections. An algorithm based on scattering integral equations is derived for an efficient parameter retrieval. Experimental measurements based on a time-division bistatic multiantenna system were conducted. It is verified that by deriving an inverse scattering problem-based algorithm, the dielectric constants of such SUTs can be effectively retrieved from the scattering data detected by a measurement setup previously designed for microwave imaging, regardless of the complexity of their cross sections. The proposed approach can be readily applied to various 2-D samples such as dielectric section bars. It can also be conveniently extended to 3-D samples in the future.
AB - Measurements of dielectric constant are of significant importance. Existing methods, contact or noncontact, require the sample under test (SUT) with a specified dimension. It can be the cross section of a rectangular waveguide or a regular-shaped reference SUT. In this work, a new approach extended from microwave imaging is proposed to remotely measure the dielectric constants of 2-D SUTs with arbitrary cross sections. An algorithm based on scattering integral equations is derived for an efficient parameter retrieval. Experimental measurements based on a time-division bistatic multiantenna system were conducted. It is verified that by deriving an inverse scattering problem-based algorithm, the dielectric constants of such SUTs can be effectively retrieved from the scattering data detected by a measurement setup previously designed for microwave imaging, regardless of the complexity of their cross sections. The proposed approach can be readily applied to various 2-D samples such as dielectric section bars. It can also be conveniently extended to 3-D samples in the future.
KW - Dielectric constant
KW - inverse scattering problem
KW - microwave imaging
KW - remote measurement
UR - http://www.scopus.com/inward/record.url?scp=85092515614&partnerID=8YFLogxK
U2 - 10.1109/LMWC.2020.3016735
DO - 10.1109/LMWC.2020.3016735
M3 - Article
AN - SCOPUS:85092515614
VL - 30
SP - 1005
EP - 1008
JO - IEEE Microwave and Wireless Components Letters
JF - IEEE Microwave and Wireless Components Letters
SN - 1531-1309
IS - 10
M1 - 9178315
ER -