Reliability analysis for competitive failure processes with multi-state degradation

Aiping Jiang, Leqing Huang, Yisha Xiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to better simulate the condition states of the system and get a more accurate reliability of the system, this paper investigates three failure modes for a single component system: Multi-state degradation and two failures due to extreme shocks and cumulative shocks. A comprehensive consideration of several internal and external factors for a system with multiple condition states would make the model more practical, applicable and realistic compared with the previous researches which only consider one side. Different degradation rates and shock rates are used simultaneously in one model, considering the different states of the system. Deterioration level and effects of shocks, corresponding system reliability is established according to the probabilistic and statistics theory. The sensitivity analysis of variables in system reliability model is also conducted to identify the most significant factors. Our results show that: (1) The system reliability decreases with accelerating rate and then the decelerating rate after reaching the peak. (2) Reliability is significantly sensitive the state transition parameters, internal degradation means and intensity of external shocks, where the company would benefit a lot from finding the optimal value of these variables, and improve the reliability of the whole system.

Original languageEnglish
Title of host publication2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728171029
DOIs
StatePublished - Aug 2020
Event2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020 - Vancouver, Canada
Duration: Aug 20 2020Aug 23 2020

Publication series

Name2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020

Conference

Conference2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020
Country/TerritoryCanada
CityVancouver
Period08/20/2008/23/20

Keywords

  • competitive failure
  • degradation
  • delayed time theory

Fingerprint

Dive into the research topics of 'Reliability analysis for competitive failure processes with multi-state degradation'. Together they form a unique fingerprint.

Cite this