Raman scattering study of stoichiometric Si and Ge type II clathrates

G. S. Nolas, C. A. Kendziora, Jan Gryko, Jianjun Dong, Charles W. Myles, Abhijit Poddar, Otto F. Sankey

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

Raman spectroscopic analysis of polycrystalline and single crystal of stoichiometric Si and Ge type II clathrates was presented. Density functional, plane-wave pseudopotential calculations were used to calculate the vibrational modes of clathrates. The 457.9 and 514.5 nm excitation of an Ar-ion laser, 647.1 nm excitation of a Kr-ion laser, and 700 nm excitation of a Ti-sapphire laser were used in Raman scattering measurements. Lowest frequency Raman-active optic 'rattle' mode, which corresponded to the vibrations of Cs atoms inside the hexakaidecahedra, was identified for Si and Ge clathrate compounds.

Original languageEnglish
Pages (from-to)7225-7230
Number of pages6
JournalJournal of Applied Physics
Volume92
Issue number12
DOIs
StatePublished - Dec 15 2002

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