Radiation testing of CCDs for space applications

C. Baltay, A. Bauer, W. Emmet, J. Jerke, D. Rabinowitz, D. Silverman, A. Szymkowiak, G. Zevi Della Porta

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


This article reports the results of radiation resistance tests of fully depleted p-channel Charge Coupled Devices (CCDs) developed at the Lawrence Berkeley National Laboratory for imaging applications in space. Several such devices were irradiated by 12 MeV protons at the tandem accelerator at the Wright Nuclear Structure Laboratory at Yale University by doses up to 8 x 1010 protons/cm2. The equivalent dose at an orbit near L2 for a six year mission in space was estimated to be an equivalent 7.3 x 10 8 12.5 MeV protons/cm2. The performance of the CCDs was measured both before and after irradiation. The charge transfer efficiency CTE was degraded from 0.999999 before irradiation to 0.999996 after the expected six year dose. The dark current, which was 3 electrons/pixel/hour before irradiation, is degraded to an equilibrium rate of 15 electrons/pixel/hour in orbit. We conclude that the performance of these devices is quite acceptable for high precision imaging in a space mission.

Original languageEnglish
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy IV
StatePublished - 2010
EventHigh Energy, Optical, and Infrared Detectors for Astronomy IV - San Diego, CA, United States
Duration: Jun 27 2010Jun 30 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


ConferenceHigh Energy, Optical, and Infrared Detectors for Astronomy IV
Country/TerritoryUnited States
CitySan Diego, CA


  • CCD detectors
  • radiation damage
  • space


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