Quantitative determination of the order parameter in epitaxial layers of ZnSnP2

S. Francoeur, G. A. Seryogin, S. A. Nikishin, H. Temkin

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15 Scopus citations


X-ray diffraction is applied to determine the degree of order in partially ordered epitaxial layers of ZnSnP2 grown on GaAs. The Bragg-Williams order parameter, used as a scaling coefficient for the structure factor of superstructure reflections, is extracted from the comparison of measured and calculated relative intensities of a set of carefully chosen reflections. The calculated diffraction patterns are obtained from the dynamical theory of x-ray diffraction. The effect of antiphase domains on the width of superstructure reflections is discussed. Order parameters up to 30% were measured.

Original languageEnglish
Pages (from-to)2017-2019
Number of pages3
JournalApplied Physics Letters
Issue number15
StatePublished - Apr 10 2000


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