Probing nanoscale pentacene films by resonant raman scattering

Rui He; Irene Dujovne; Liwei Chen; Qian Miao; Cyrus F. Hirjibehedin; Aron Pinczuk; Colin Nuckolls; Christian Kloc; Graciela B. Blanchet

doi:10.1063/1.1994490

Probing nanoscale pentacene films by resonant raman scattering

Rui He, Irene Dujovne, Liwei Chen, Qian Miao, Cyrus F. Hirjibehedin, Aron Pinczuk, Colin Nuckolls, Christian Kloc, Graciela B. Blanchet

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Resonant enhancements of Raman scattering intensities offer the sensitivity required to study nanoscale pentacene films that reach into monolayer thickness. In the results reported here structural characterization of ultra-thin layers and of their fundamental optical properties are investigated by resonant Raman scattering from intra-molecular and inter-molecular vibrations. In this work Raman methods emerge as ideal tools for the study of physics and characterization of ultra-thin nanoscale films of molecular organic materials fabricated on diverse substrates of current and future devices.

Original language	English
Title of host publication	PHYSICS OF SEMICONDUCTORS
Subtitle of host publication	27th International Conference on the Physics of Semiconductors, ICPS-27
Pages	1087-1088
Number of pages	2
DOIs	https://doi.org/10.1063/1.1994490
State	Published - Jun 30 2005
Event	PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States Duration: Jul 26 2004 → Jul 30 2004

Publication series

Name	AIP Conference Proceedings
Volume	772
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
Country/Territory	United States
City	Flagstaff, AZ
Period	07/26/04 → 07/30/04

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10.1063/1.1994490

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He, R., Dujovne, I., Chen, L., Miao, Q., Hirjibehedin, C. F., Pinczuk, A., Nuckolls, C., Kloc, C., & Blanchet, G. B. (2005). Probing nanoscale pentacene films by resonant raman scattering. In PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 (pp. 1087-1088). (AIP Conference Proceedings; Vol. 772). https://doi.org/10.1063/1.1994490

@inproceedings{d3b83ed947f740308849d3979416d414,

title = "Probing nanoscale pentacene films by resonant raman scattering",

abstract = "Resonant enhancements of Raman scattering intensities offer the sensitivity required to study nanoscale pentacene films that reach into monolayer thickness. In the results reported here structural characterization of ultra-thin layers and of their fundamental optical properties are investigated by resonant Raman scattering from intra-molecular and inter-molecular vibrations. In this work Raman methods emerge as ideal tools for the study of physics and characterization of ultra-thin nanoscale films of molecular organic materials fabricated on diverse substrates of current and future devices.",

author = "Rui He and Irene Dujovne and Liwei Chen and Qian Miao and Hirjibehedin, {Cyrus F.} and Aron Pinczuk and Colin Nuckolls and Christian Kloc and Blanchet, {Graciela B.}",

year = "2005",

month = jun,

day = "30",

doi = "10.1063/1.1994490",

language = "English",

isbn = "0735402574",

series = "AIP Conference Proceedings",

pages = "1087--1088",

booktitle = "PHYSICS OF SEMICONDUCTORS",

note = "PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 ; Conference date: 26-07-2004 Through 30-07-2004",

}

He, R, Dujovne, I, Chen, L, Miao, Q, Hirjibehedin, CF, Pinczuk, A, Nuckolls, C, Kloc, C & Blanchet, GB 2005, Probing nanoscale pentacene films by resonant raman scattering. in PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27. AIP Conference Proceedings, vol. 772, pp. 1087-1088, PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27, Flagstaff, AZ, United States, 07/26/04. https://doi.org/10.1063/1.1994490

Probing nanoscale pentacene films by resonant raman scattering. / He, Rui; Dujovne, Irene; Chen, Liwei et al.
PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27. 2005. p. 1087-1088 (AIP Conference Proceedings; Vol. 772).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Pinczuk, Aron

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Probing nanoscale pentacene films by resonant raman scattering

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