Probing nanoscale pentacene films by resonant raman scattering

Rui He, Irene Dujovne, Liwei Chen, Qian Miao, Cyrus F. Hirjibehedin, Aron Pinczuk, Colin Nuckolls, Christian Kloc, Graciela B. Blanchet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Resonant enhancements of Raman scattering intensities offer the sensitivity required to study nanoscale pentacene films that reach into monolayer thickness. In the results reported here structural characterization of ultra-thin layers and of their fundamental optical properties are investigated by resonant Raman scattering from intra-molecular and inter-molecular vibrations. In this work Raman methods emerge as ideal tools for the study of physics and characterization of ultra-thin nanoscale films of molecular organic materials fabricated on diverse substrates of current and future devices.

Original languageEnglish
Title of host publicationPHYSICS OF SEMICONDUCTORS
Subtitle of host publication27th International Conference on the Physics of Semiconductors, ICPS-27
Pages1087-1088
Number of pages2
DOIs
StatePublished - Jun 30 2005
EventPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States
Duration: Jul 26 2004Jul 30 2004

Publication series

NameAIP Conference Proceedings
Volume772
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferencePHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
CountryUnited States
CityFlagstaff, AZ
Period07/26/0407/30/04

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    He, R., Dujovne, I., Chen, L., Miao, Q., Hirjibehedin, C. F., Pinczuk, A., Nuckolls, C., Kloc, C., & Blanchet, G. B. (2005). Probing nanoscale pentacene films by resonant raman scattering. In PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 (pp. 1087-1088). (AIP Conference Proceedings; Vol. 772). https://doi.org/10.1063/1.1994490