TY - GEN
T1 - Probabilistic analysis of a bimaterial disc
AU - Ekwaro-Osire, S.
AU - Dhorje, M.
AU - Lolge, G.
AU - Cárdenas-García, J. F.
PY - 2007
Y1 - 2007
N2 - The joining of dissimilar materials occurs and is common to MEMS devices and other structures critical to everyday usage. The problem of a bimaterial interface is of particular interest for some of these applications, where in an effort to gain greater insight, an inverse problem methodology may be applied. Considering only the birefringent or photoelastic response of a bimaterial interface it is possible to define several inverse problems: (a) For known geometry and material properties determine the applied boundary loads; and, (b) for known geometry and applied boundary loads determine the material properties of all material components. This paper uses a bimaterial circular disk to explore these two inverse problems of interest.
AB - The joining of dissimilar materials occurs and is common to MEMS devices and other structures critical to everyday usage. The problem of a bimaterial interface is of particular interest for some of these applications, where in an effort to gain greater insight, an inverse problem methodology may be applied. Considering only the birefringent or photoelastic response of a bimaterial interface it is possible to define several inverse problems: (a) For known geometry and material properties determine the applied boundary loads; and, (b) for known geometry and applied boundary loads determine the material properties of all material components. This paper uses a bimaterial circular disk to explore these two inverse problems of interest.
UR - http://www.scopus.com/inward/record.url?scp=36048973235&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:36048973235
SN - 1604232226
SN - 9781604232226
T3 - Proceedings of the SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2007
SP - 1339
EP - 1345
BT - Proceedings of the SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2007
T2 - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2007
Y2 - 3 June 2007 through 6 June 2007
ER -