TY - GEN

T1 - Probabilistic analysis of a bimaterial disc

AU - Ekwaro-Osire, S.

AU - Dhorje, M.

AU - Lolge, G.

AU - Cárdenas-García, J. F.

N1 - Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.

PY - 2007

Y1 - 2007

N2 - The joining of dissimilar materials occurs and is common to MEMS devices and other structures critical to everyday usage. The problem of a bimaterial interface is of particular interest for some of these applications, where in an effort to gain greater insight, an inverse problem methodology may be applied. Considering only the birefringent or photoelastic response of a bimaterial interface it is possible to define several inverse problems: (a) For known geometry and material properties determine the applied boundary loads; and, (b) for known geometry and applied boundary loads determine the material properties of all material components. This paper uses a bimaterial circular disk to explore these two inverse problems of interest.

AB - The joining of dissimilar materials occurs and is common to MEMS devices and other structures critical to everyday usage. The problem of a bimaterial interface is of particular interest for some of these applications, where in an effort to gain greater insight, an inverse problem methodology may be applied. Considering only the birefringent or photoelastic response of a bimaterial interface it is possible to define several inverse problems: (a) For known geometry and material properties determine the applied boundary loads; and, (b) for known geometry and applied boundary loads determine the material properties of all material components. This paper uses a bimaterial circular disk to explore these two inverse problems of interest.

UR - http://www.scopus.com/inward/record.url?scp=36048973235&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:36048973235

SN - 1604232226

SN - 9781604232226

T3 - Proceedings of the SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2007

SP - 1339

EP - 1345

BT - Proceedings of the SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2007

Y2 - 3 June 2007 through 6 June 2007

ER -