Abstract
The pre-breakdown phase is monitored by recording the traveling and reflected power, and the luminosity, spatially integrated with high temporal resolution or imaged with a framing camera. The pressure dependent breakdown characteristics, such as appearance, breakdown field, and temporal behavior of electric signals are compared with the solid dielectric/vacuum interface breakdown and volume breakdown results.
| Original language | English |
|---|---|
| Pages (from-to) | 124 |
| Number of pages | 1 |
| Journal | IEEE International Conference on Plasma Science |
| State | Published - 2000 |
| Event | ICOPS 2000 - 27th IEEE International Conference on Plasma Science - New Orleans, LA, USA Duration: Jun 4 2000 → Jun 7 2000 |
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Cite this
Neuber, A., Hemmert, D., Krompholz, H., Hatfield, L. L., & Kristiansen, M. (2000). Pressure dependence of high power microwave solid dielectric/gas interface breakdown. IEEE International Conference on Plasma Science, 124.