Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces

Sezin Galioǧlu, Mariam N. Ismail, Juliusz Warzywoda, Albert Sacco, Burcu Akata

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Oriented polycrystalline ETS-10 thin films (average thickness ∼1.50-1.75 μm) were prepared on the ITO glass substrates using secondary growth of ETS-10 multilayers with a partial a(b)-out-of-plane preferred crystal orientation. After secondary growth, the films showed a columnar grain microstructure, and a significantly increased degree of a(b)-out-of-plane orientation. This orientation is desirable for advanced applications of ETS-10 films. The prepared films were strongly attached to the ITO glass substrates as evidenced by the absence of discernible differences in the substrate coverage with film after a 60-min ultrasonication in water.

Original languageEnglish
Pages (from-to)401-406
Number of pages6
JournalMicroporous and Mesoporous Materials
Volume131
Issue number1-3
DOIs
StatePublished - Jun 2010

Keywords

  • ETS-10
  • Indium tin oxide
  • Secondary growth
  • Thin films
  • Titanosilicates

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