Post treatments of plasma-enhanced chemical vapor deposited hydrogenated amorphous silicon carbide for low dielectric constant films

B. Lahlouh, T. Rajagopalan, N. Biswas, J. Sun, D. Huang, S. L. Simon, J. A. Lubguban, S. Gangopadhyay

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Post treatments by annealing or supercritical carbon dioxide (SCCO 2) exposure of plasma-enhanced chemical vapor deposited hydrogenated amorphous silicon carbide (a-SiC:H) films are reported to reduce the dielectric constant up to 2.1. The a-SiC:H films were prepared using diethylsilane diluted in methane. The deposition precursors and conditions were chosen to fabricate a thermally unstable a-SiC:H film with a high concentration of CHn (n = 1, 2, 3) functional groups. The Fourier transform infra-red spectroscopy measurements of as-deposited films show a-SiC:H networks and presence of a-C:H moieties throughout the film. The films were then annealed in vacuum up to 450 °C to remove thermally unstable CHn as well as other species. After annealing, the dielectric constant of the films decreased from 4.2 up to 2.1 due to the decrease in film density. The reduction suggests the presence of molecular voids/pores. Annealing produced a stable film with thickness decreasing by a maximum of 6% only. SCCO2 treatment was also explored and found to be more effective in the extraction of CHn and other species at 200 °C.

Original languageEnglish
Pages (from-to)109-114
Number of pages6
JournalThin Solid Films
Volume497
Issue number1-2
DOIs
StatePublished - Feb 21 2006

Keywords

  • Chemical vapor deposition (CVD)
  • Dielectrics
  • Heat treatment
  • Silicon carbide

Fingerprint Dive into the research topics of 'Post treatments of plasma-enhanced chemical vapor deposited hydrogenated amorphous silicon carbide for low dielectric constant films'. Together they form a unique fingerprint.

Cite this