We describe the use of a plasmonic version of a quantum eraser for imaging applications. Two perpendicular surface plasmon polariton (SPP) beams were excited in a glass-metal sample using a leakage radiation microscope. The polarization state of the SPP-coupled radiation leaked to the sample substrate permits to identify the path of photons along the metal-air interface of the sample. Introduction of a linear polarizer after the microscope high numerical aperture lens erases the which-path information. This enabled us to image on the microscope charge coupled device camera the interference pattern formed in the sample surface.