Plasma-source mass spectrometry for speciation analysis: State-of-the-art

Steven J. Ray, Francisco Andrade, Gerardo Gamez, Denise McClenathan, Duane Rogers, Gregory Schilling, William Wetzel, Gary M. Hieftje

Research output: Contribution to journalReview article

47 Scopus citations

Abstract

Current and emerging capabilities of plasma-source mass spectrometry (PS-MS) as it is employed for elemental speciation analysis are reviewed. Fundamental concepts and their advantageous aspects, experimental conditions, and analytical performance are described and illustrated by recent examples from the literature. Novel instrumentation, techniques, and strategies for inductively-coupled plasma mass spectrometry (ICP-MS), microwave-induced plasma (MIP) mass spectrometry, glow-discharge (GD) mass spectrometry, and electrospray ionization (ESI), among others, are described. The use of ionization sources that provide tunable ionization, others that can be modulated between different sets of operating conditions, and others used in parallel is also examined.

Original languageEnglish
Pages (from-to)3-34
Number of pages32
JournalJournal of Chromatography A
Volume1050
Issue number1
DOIs
StatePublished - Sep 24 2004

Keywords

  • Electrospray ionization mass spectrometry
  • Elemental speciation
  • Time-of-Flight mass spectrometry
  • Tunable ionization sources

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    Ray, S. J., Andrade, F., Gamez, G., McClenathan, D., Rogers, D., Schilling, G., Wetzel, W., & Hieftje, G. M. (2004). Plasma-source mass spectrometry for speciation analysis: State-of-the-art. Journal of Chromatography A, 1050(1), 3-34. https://doi.org/10.1016/j.chroma.2004.07.107