Physical aging of thin films

I. Spinu, G. B. McKenna

Research output: Contribution to conferencePaperpeer-review

Abstract

The physical aging behavior of Nylon 66 and polyethylene terephtalate (PET) films as a function of aging temperature, magnitude of applied stress and aging time has been investigated. Creep tests were performed for samples quenched from a stabilization temperature of 160°C (Nylon 66) or 130°C (PET) to aging temperatures between 25°C and 130°C, for aging times ranging from 0.5 to 166 hours, and at stresses levels from 8 MPa to 40 MPa. For Nylon 66 the creep compliance curves at different aging times were able to be superimposed in the temperature range of 25 - 60°C. For PET the creep compliance curves at different aging times were able to be superimposed only at 60°C. The double logarithmic shift rate was calculated and its dependence on aging temperature and applied stress was determined.

Original languageEnglish
Pages2684-2697
Number of pages14
StatePublished - 1995
EventProceedings of the 53rd Annual Technical Conference. Part 1 (of 3) - Boston, MA, USA
Duration: May 7 1995Oct 11 1995

Conference

ConferenceProceedings of the 53rd Annual Technical Conference. Part 1 (of 3)
CityBoston, MA, USA
Period05/7/9510/11/95

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