Parametric Probabilistic Approach for Limited Data in Non-Linear Cumulative Fatigue Damage

Joao Paulo Dias, Stephen Ekwaro-Osire, Americo Cunha Jr, Fisseha Alemayehu, Shweta Dabetwar, Abraham Nispel, Haileyesus Endeshaw

Research output: Contribution to conference › Paper › peer-review

Fingerprint

Dive into the research topics of 'Parametric Probabilistic Approach for Limited Data in Non-Linear Cumulative Fatigue Damage'. Together they form a unique fingerprint.

Engineering & Materials Science