On the preparation of as-produced and purified single-walled carbon nanotube samples for standardized X-ray diffraction characterization

Rula M. Allaf; Iris V. Rivero; Shayla S. Spearman; Louisa J. Hope-Weeks

doi:10.1016/j.matchar.2011.06.005

On the preparation of as-produced and purified single-walled carbon nanotube samples for standardized X-ray diffraction characterization

Rula M. Allaf, Iris V. Rivero, Shayla S. Spearman, Louisa J. Hope-Weeks

Chemistry and Biochemistry

Research output: Contribution to journal › Article

7 Scopus citations

Abstract

The aim of this research was to specify proper sample conditioning for acquiring representative X-ray diffraction (XRD) profiles for single-walled carbon nanotube (SWCNT) samples. In doing so, a specimen preparation method for quantitative XRD characterization of as-produced and purified arc-discharge SWCNT samples has been identified. Series of powder XRD profiles were collected at different temperatures, states, and points of time to establish appropriate conditions for acquiring XRD profiles without inducing much change to the specimen. It was concluded that heating in the 300-450 °C range for 20 minutes, preferably vacuum-assisted, and then sealing the sample is an appropriate XRD specimen preparation technique for purified arc-discharge SWCNT samples, while raw samples do not require preconditioning for characterization.

Original language	English
Pages (from-to)	857-864
Number of pages	8
Journal	Materials Characterization
Volume	62
Issue number	9
DOIs	https://doi.org/10.1016/j.matchar.2011.06.005
State	Published - Sep 2011

Keywords

Adsorption
Heat treatment
Sample preparation
Single-walled carbon nanotubes
X-ray diffraction

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Allaf, R. M., Rivero, I. V., Spearman, S. S., & Hope-Weeks, L. J. (2011). On the preparation of as-produced and purified single-walled carbon nanotube samples for standardized X-ray diffraction characterization. Materials Characterization, 62(9), 857-864. https://doi.org/10.1016/j.matchar.2011.06.005

@article{a91d76b4f87b41abb60ce1e282255390,

title = "On the preparation of as-produced and purified single-walled carbon nanotube samples for standardized X-ray diffraction characterization",

abstract = "The aim of this research was to specify proper sample conditioning for acquiring representative X-ray diffraction (XRD) profiles for single-walled carbon nanotube (SWCNT) samples. In doing so, a specimen preparation method for quantitative XRD characterization of as-produced and purified arc-discharge SWCNT samples has been identified. Series of powder XRD profiles were collected at different temperatures, states, and points of time to establish appropriate conditions for acquiring XRD profiles without inducing much change to the specimen. It was concluded that heating in the 300-450 °C range for 20 minutes, preferably vacuum-assisted, and then sealing the sample is an appropriate XRD specimen preparation technique for purified arc-discharge SWCNT samples, while raw samples do not require preconditioning for characterization.",

keywords = "Adsorption, Heat treatment, Sample preparation, Single-walled carbon nanotubes, X-ray diffraction",

author = "Allaf, {Rula M.} and Rivero, {Iris V.} and Spearman, {Shayla S.} and Hope-Weeks, {Louisa J.}",

year = "2011",

month = sep,

doi = "10.1016/j.matchar.2011.06.005",

language = "English",

volume = "62",

pages = "857--864",

journal = "Materials Characterization",

issn = "1044-5803",

number = "9",

}

TY - JOUR

T1 - On the preparation of as-produced and purified single-walled carbon nanotube samples for standardized X-ray diffraction characterization

AU - Allaf, Rula M.

AU - Rivero, Iris V.

AU - Spearman, Shayla S.

AU - Hope-Weeks, Louisa J.

PY - 2011/9

Y1 - 2011/9

N2 - The aim of this research was to specify proper sample conditioning for acquiring representative X-ray diffraction (XRD) profiles for single-walled carbon nanotube (SWCNT) samples. In doing so, a specimen preparation method for quantitative XRD characterization of as-produced and purified arc-discharge SWCNT samples has been identified. Series of powder XRD profiles were collected at different temperatures, states, and points of time to establish appropriate conditions for acquiring XRD profiles without inducing much change to the specimen. It was concluded that heating in the 300-450 °C range for 20 minutes, preferably vacuum-assisted, and then sealing the sample is an appropriate XRD specimen preparation technique for purified arc-discharge SWCNT samples, while raw samples do not require preconditioning for characterization.

AB - The aim of this research was to specify proper sample conditioning for acquiring representative X-ray diffraction (XRD) profiles for single-walled carbon nanotube (SWCNT) samples. In doing so, a specimen preparation method for quantitative XRD characterization of as-produced and purified arc-discharge SWCNT samples has been identified. Series of powder XRD profiles were collected at different temperatures, states, and points of time to establish appropriate conditions for acquiring XRD profiles without inducing much change to the specimen. It was concluded that heating in the 300-450 °C range for 20 minutes, preferably vacuum-assisted, and then sealing the sample is an appropriate XRD specimen preparation technique for purified arc-discharge SWCNT samples, while raw samples do not require preconditioning for characterization.

KW - Adsorption

KW - Heat treatment

KW - Sample preparation

KW - Single-walled carbon nanotubes

KW - X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=79960306186&partnerID=8YFLogxK

U2 - 10.1016/j.matchar.2011.06.005

DO - 10.1016/j.matchar.2011.06.005

M3 - Article

AN - SCOPUS:79960306186

VL - 62

SP - 857

EP - 864

JO - Materials Characterization

JF - Materials Characterization

SN - 1044-5803

IS - 9

ER -