On Effective Use of Reliability Models and Defect Data in Software Development

Rattikorn Hewett, A. Kulkarni, R. Seker, C. Stringfellow

Research output: Contribution to conference › Paper › peer-review

Fingerprint

Dive into the research topics of 'On Effective Use of Reliability Models and Defect Data in Software Development'. Together they form a unique fingerprint.

Engineering & Materials Science