TY - GEN
T1 - On effective use of reliability models and defect data in software development
AU - Hewett, Rattikorn
AU - Kulkarni, Aniruddha
AU - Seker, Remzi
AU - Stringfellow, Catherine
PY - 2006/1/1
Y1 - 2006/1/1
N2 - In software technology today, several development methodologies such as extreme programming and open source development increasingly use feedback from customer testing. This makes the customer defect data become more readily available. This paper proposes an effective use of reliability models and defect data to help managers make software release decisions by applying a strategy for selecting a suitable reliability model, which best fits the customer defect data as testing progresses. We validate the proposed approach in an empirical study using a dataset of defect reports obtained from testing of three releases of a large medical system. The paper describes detailed results of our experiments and concludes with suggested guidelines on the usage of reliability models and defect data.
AB - In software technology today, several development methodologies such as extreme programming and open source development increasingly use feedback from customer testing. This makes the customer defect data become more readily available. This paper proposes an effective use of reliability models and defect data to help managers make software release decisions by applying a strategy for selecting a suitable reliability model, which best fits the customer defect data as testing progresses. We validate the proposed approach in an empirical study using a dataset of defect reports obtained from testing of three releases of a large medical system. The paper describes detailed results of our experiments and concludes with suggested guidelines on the usage of reliability models and defect data.
UR - http://www.scopus.com/inward/record.url?scp=77955637268&partnerID=8YFLogxK
U2 - 10.1109/TPSD.2006.5507460
DO - 10.1109/TPSD.2006.5507460
M3 - Conference contribution
SN - 1424403596
SN - 9781424403592
T3 - 2006 IEEE Region 5 Conference
SP - 67
EP - 71
BT - 2006 IEEE Region 5 Conference
PB - IEEE Computer Society
T2 - 2006 IEEE Region 5 Conference
Y2 - 7 April 2006 through 8 April 2006
ER -