On effective use of reliability models and defect data in software development

Rattikorn Hewett, Aniruddha Kulkarni, Remzi Seker, Catherine Stringfellow

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In software technology today, several development methodologies such as extreme programming and open source development increasingly use feedback from customer testing. This makes the customer defect data become more readily available. This paper proposes an effective use of reliability models and defect data to help managers make software release decisions by applying a strategy for selecting a suitable reliability model, which best fits the customer defect data as testing progresses. We validate the proposed approach in an empirical study using a dataset of defect reports obtained from testing of three releases of a large medical system. The paper describes detailed results of our experiments and concludes with suggested guidelines on the usage of reliability models and defect data.

Original languageEnglish
Title of host publication2006 IEEE Region 5 Conference
PublisherIEEE Computer Society
Pages67-71
Number of pages5
ISBN (Print)1424403596, 9781424403592
DOIs
StatePublished - Jan 1 2006
Event2006 IEEE Region 5 Conference - San Antonio, TX, United States
Duration: Apr 7 2006Apr 8 2006

Publication series

Name2006 IEEE Region 5 Conference

Conference

Conference2006 IEEE Region 5 Conference
CountryUnited States
CitySan Antonio, TX
Period04/7/0604/8/06

Fingerprint Dive into the research topics of 'On effective use of reliability models and defect data in software development'. Together they form a unique fingerprint.

  • Cite this

    Hewett, R., Kulkarni, A., Seker, R., & Stringfellow, C. (2006). On effective use of reliability models and defect data in software development. In 2006 IEEE Region 5 Conference (pp. 67-71). [5507460] (2006 IEEE Region 5 Conference). IEEE Computer Society. https://doi.org/10.1109/TPSD.2006.5507460