“Novel BiST Methods for Parametric Test in WLAN”, D. Webster, G. Thiagarajan, S. Ramakrishnan, S. Gunturi, A. Sontakke, and D.Y.C. Lie, Proc. IEEE 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, pp. 112-115, January 11-13, New Orleans, LA, USA (2010)

Research output: Contribution to conferencePaperpeer-review

Abstract

“Novel BiST Methods for Parametric Test in WLAN”, D. Webster, G. Thiagarajan, S. Ramakrishnan, S. Gunturi, A. Sontakke, and D.Y.C. Lie, Proc. IEEE 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, pp. 112-115, January 11-13, New Orleans, LA, USA (2010)
Original languageEnglish
StatePublished - Jan 2010

Fingerprint Dive into the research topics of '“Novel BiST Methods for Parametric Test in WLAN”, D. Webster, G. Thiagarajan, S. Ramakrishnan, S. Gunturi, A. Sontakke, and D.Y.C. Lie, Proc. IEEE 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, pp. 112-115, January 11-13, New Orleans, LA, USA (2010)'. Together they form a unique fingerprint.

Cite this