Novel BiST methods for parametric test in wireless transceivers

D. Webster, G. Thiagarajan, S. Ramakrishnan, S. Gunturi, A. Sontakke, D. Y.C. Lie

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

This paper describes RF Built-in Self Test (BiST) techniques to test the performance of a RF CMOS integrated wireless transceiver using on-chip digital resources as both the stimuli and response analyzer. Using a defectoriented approach, key RF blocks as well as the overall functionality and performance of the device are analyzed using a combination of block level and loopback testing. Using these methods, contributors to Error Vector Magnitude (EVM) such as amplifier gain, phase noise, and linearity performance (IP3) can be estimated and collected to predict the functional performance of a Digital Radio Processor (DRP) for wireless applications.

Original languageEnglish
Title of host publication2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2010 - Digest of Papers
Pages112-115
Number of pages4
DOIs
StatePublished - 2010
Event2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2010 - New Orleans, LA, United States
Duration: Jan 11 2010Jan 13 2010

Publication series

Name2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2010 - Digest of Papers

Conference

Conference2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2010
CountryUnited States
CityNew Orleans, LA
Period01/11/1001/13/10

Keywords

  • Built-in self-testing (BiST)
  • CMOS integrated circuits
  • Wireless LAN

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    Webster, D., Thiagarajan, G., Ramakrishnan, S., Gunturi, S., Sontakke, A., & Lie, D. Y. C. (2010). Novel BiST methods for parametric test in wireless transceivers. In 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2010 - Digest of Papers (pp. 112-115). [5422977] (2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2010 - Digest of Papers). https://doi.org/10.1109/SMIC.2010.5422977