Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

Jing Dong; Fazhong Shen; Yazhou Dong; Ying Wang; Wenli Fu; Huan Li; Dexin Ye; Bin Zhang; Jiangtao Huangfu; Shan Qiao; Yongzhi Sun; Changzhi Li; Lixin Ran

doi:10.1109/TMTT.2016.2588487

Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

Jing Dong, Fazhong Shen, Yazhou Dong, Ying Wang, Wenli Fu, Huan Li, Dexin Ye, Bin Zhang, Jiangtao Huangfu, Shan Qiao, Yongzhi Sun, Changzhi Li, Lixin Ran

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies.

Original language	English
Article number	7519027
Pages (from-to)	2883-2893
Number of pages	11
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	64
Issue number	9
DOIs	https://doi.org/10.1109/TMTT.2016.2588487
State	Published - Sep 2016

Keywords

Complex permittivity
Rayleigh approximation
noncontact measurement
subwavelength resonance

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10.1109/TMTT.2016.2588487

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title = "Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies",

abstract = "Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies.",

keywords = "Complex permittivity, Rayleigh approximation, noncontact measurement, subwavelength resonance",

author = "Jing Dong and Fazhong Shen and Yazhou Dong and Ying Wang and Wenli Fu and Huan Li and Dexin Ye and Bin Zhang and Jiangtao Huangfu and Shan Qiao and Yongzhi Sun and Changzhi Li and Lixin Ran",

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T1 - Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

AU - Dong, Jing

AU - Shen, Fazhong

AU - Dong, Yazhou

AU - Wang, Ying

AU - Fu, Wenli

AU - Li, Huan

AU - Ye, Dexin

AU - Zhang, Bin

AU - Huangfu, Jiangtao

AU - Qiao, Shan

AU - Sun, Yongzhi

AU - Li, Changzhi

AU - Ran, Lixin

PY - 2016/9

Y1 - 2016/9

N2 - Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies.

AB - Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies.

KW - Complex permittivity

KW - Rayleigh approximation

KW - noncontact measurement

KW - subwavelength resonance

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JF - IEEE Transactions on Microwave Theory and Techniques

IS - 9

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Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

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