Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

Jing Dong, Fazhong Shen, Yazhou Dong, Ying Wang, Wenli Fu, Huan Li, Dexin Ye, Bin Zhang, Jiangtao Huangfu, Shan Qiao, Yongzhi Sun, Changzhi Li, Lixin Ran

Research output: Contribution to journalArticle

18 Scopus citations

Abstract

Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies.

Original languageEnglish
Article number7519027
Pages (from-to)2883-2893
Number of pages11
JournalIEEE Transactions on Microwave Theory and Techniques
Volume64
Issue number9
DOIs
StatePublished - Sep 2016

Keywords

  • Complex permittivity
  • Rayleigh approximation
  • noncontact measurement
  • subwavelength resonance

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