New Paramagnetic Susceptibility Thermometers for Fundamental Physics Measurements

D. A. Sergatskov, P. K. Day, A. V. Babkin, R. C. Nelson, T. D. Mccarson, S. T.P. Boyd, R. V. Duncan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations


New paramagnetic susceptibility thermometers have been developed for use in fundamental physics missions in earth orbit. These devices use a SQUID magnetometer to measure the variation in the dc magnetization of a thermometric element that consists of a dilute concentration of manganese in a palladium matrix. Near 2.2 K these new PdMn thermometers have demonstrated a temperature resolution of better than 100 pK/√Hz and a time constant of 50 ms when operated with a 50 K/W thermal resistance to the liquid helium sample. These thermometers have been observed to be remarkably stable, with a drift of less than 10 fK/s. The observed power spectral density of the noise from these thermometers is consistent with separate measurements of the device's time constant and thermal standoff from the bath. Recently these PdMn materials have been made into thin films and microstructures for use in future studies of quantum liquids, and for possible use in a new class of bolometers and radiometers. These thermometers have been integrated into an experimental cell and thermal isolation network that are adequate to keep stray heats stable to within a few picowatts, with no systematic temperature errors greater than 60 pK, over the course of a planned fundamental physics experiment on Earth orbit.

Original languageEnglish
Title of host publicationTemperature
Subtitle of host publicationIts Measurement and Control in Science and Industry; Volume VII; 8th Temperature Symposium
EditorsDean C. Ripple
PublisherAmerican Institute of Physics Inc.
Number of pages5
ISBN (Electronic)0735401535
StatePublished - Sep 29 2003
Event8th Temperature Symposium: Its Measurement and Control in Science and Industry - Chicago, United States
Duration: Oct 21 2002Oct 24 2002

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Conference8th Temperature Symposium: Its Measurement and Control in Science and Industry
Country/TerritoryUnited States


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